Spectral Testing of Digital Circuits
نویسندگان
چکیده
منابع مشابه
Static Simulation of CNTFET-based Digital Circuits
In this paper we implement a simple DC model for CNTFETs already proposed by us in order to carry out static analysis of basic digital circuits. To verify the validity of the obtained results, they are compared with those of Wong model, resulting in good agreement, but obtaining a lighter ensuring compile and shorter execution time, which are the main character...
متن کاملTesting Digital Circuits with Constraints
* This work was done at Stanford-CRC and was supported by King Fahd University of Petroleum and Minerals. It was also supported by DARPA under contract No. DABT63-97-C-0024 (ROAR project). The authors would like to thank Chien-Mo Li and Chao-Wen Tseng for their help. Abstract Many digital circuits have constraints on the logic values a set of signal lines can have. In this paper, we present two...
متن کاملTesting Technique for Digital Circuits
In this paper, we present a method of testing digital circuits during normal operation. The resources used to perform on-line testing are those which are inserted to alleviate the off-line testing problem. The off-line testing resources are modified such that during system operation they can also observe the normal inputs and outputs of a combinational circuit under test. The normal inputs to t...
متن کاملDynamic Simulation of CNTFET-Based Digital Circuits
In this paper we propose a simulation study to carry out dynamic analysis of CNTFET-based digital circuit, introducing in the semi-empirical compact model for CNTFETs, already proposed by us, both the quantum capacitance effects and the sub-threshold currents. To verify the validity of the obtained results, a comparison with Wong model was carried out. Our mode...
متن کاملBoolean Techniques in Testing of Digital Circuits
Currently, Very Large Scale Integrated (VLSI) circuits and the resulting digital systems are widely used in almost all areas of human’s life. To ensure the validity of these systems, error-free VLSI circuits are becoming more and more important. With the increasing complexity of VLSI circuits, the cost for the test on VLSI circuits has risen dramatically. So it is necessary to reduce the cost o...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: VLSI Design
سال: 2002
ISSN: 1065-514X,1563-5171
DOI: 10.1080/10655140290009828